BOSTON — Teradyne Inc. here today moved to lower the cost of IC test, announcing a new line of automatic test equipment (ATE) that incorporates a flexible, modular design for a range of applications.
Building a modular test strategy can provide great flexibility in capabilities, or the system can be tailor-made for specific requirements. Often a hybrid approach encompassing traditional box ...
San Francisco – NPTest Inc. last week unveiled an “open” and modular IC tester that promises to lower the cost of semiconductor test by half. The former Schlumberger Semiconductor Solutions said that ...
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