Image data fusion of SIMS and TOF-SIMS with a high spatial resolution is helpful to obtain a clearer score image by PCA. An image data fusion of SIMS and TOF-SMS in high spatial and mass resolution ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...
ION TOF. TOF-SIMS 5, Ultra high vacuum time-of-flight mass spectrometer for chemical imaging, ion intensity mapping, depth profiling, and static mass spectra. This equipment is engineered for the ...
David J Scurr and Matthew Piggott describe how time-of-flight secondary ion mass spectrometry is helping scientists in a variety of industries to understand problems related to materials science ...
Editor’s note: An open house is planned at the University of Delaware’s Surface Analysis Facility, located in Lammot du Pont Laboratory on UD’s Newark campus Friday, Sept. 23, from noon to 2 p.m. The ...
Stephan, T., Rost, D., Vicenzi, Edward P., Bullock, Emma S., MacPherson, Glenn J., Westphal, A. J., Snead, C. J., Flynn, G. J., Sandford, S. A., and Zolensky, M. E ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback