While most countries have switched to digital broadcasting, and most broadcasts themselves have programming on 24/7 now, it’s hard to remember the ancient times of analog broadcasts that would ...

Long before HD and digital television, before cable and flat screens, Channel 6 looked a whole lot different. A slide, called a test pattern, was the first-ever image broadcast on KOTV on October 15th ...

75 Years On News On 6: First KOTV Test Pattern Aired It is a big anniversary in the history of our station, KOTV. In 2024, we are celebrating 75 years on the air. October 15 is the anniversary of the ...

Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based ...

Born between 1946 and 1964, baby boomers experienced a world of typewriters, traveler's checks, and duck-and-cover drills.

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...